Atomic force microscopy (AFM) is a very popular analysis tool for 3D surface topology visualization and other measurements on a wide range of materials at nanoscales ...
Photolithography involves the selective exposure of a photosensitive material to light, using a UV light source and a collimating optical system to create an image of a patterned mask onto a substrate ...
In a new publication from Opto-Electronic Advances; DOI 10.29026/oea.2021.210048, the research group of Professor Venugopal Rao Soma from the University of Hyderabad, India, discuss recent advances in ...
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