Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

Thought LeaderProf. Dr. Sergei KalininProfessor & Chief Scientist in AI/ML for Physical SciencesUniversity of Tennessee & Pacific Northwest Laboratory In this interview, Prof. Dr. Sergei Kalinin ...

Overview of the main types of Scannig Probe Microscope types: Scanning tunneling microscope (STM) – using the tunneling current I between the outermost atom of a conducting probe within an atomic ...

What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...

An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...

Sample preparation will vary depending on the sample, imaging mode, and size of desired images. You will likely need to do a literature search to find the preparation best for your sample. Smaller ...

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Raman spectroscopic imaging is a powerful, versatile and increasingly common microscopy technique that can quickly identify molecules in a sample and visualize their distribution in three dimensions.

The inverted Zeiss CLSM 510 laser scanning confocal microscope is equipped with three PMT detectors, seven laser lines (405, 458, 477, 488, 514, 543, 633 nm), motorized Z-drive and a wide range of ...

The inverted Nikon N-SIM/A1 microscope is a combination structured illumination microscopy (SIM), laser scanning confocal and total internal reflection fluorescence (TIRF) microscopy system. SIM and ...