Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

Thought LeaderProf. Dr. Sergei KalininProfessor & Chief Scientist in AI/ML for Physical SciencesUniversity of Tennessee & Pacific Northwest Laboratory In this interview, Prof. Dr. Sergei Kalinin ...

Due to the nature of light, a traditional optical microscope can be employed to attain a maximum magnification of around 800–1000x. For further magnification, scanning electron microscopes (SEMs) can ...

Overview of the main types of Scannig Probe Microscope types: Scanning tunneling microscope (STM) – using the tunneling current I between the outermost atom of a conducting probe within an atomic ...

What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...

The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on ...

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The inverted Zeiss CLSM 510 laser scanning confocal microscope is equipped with three PMT detectors, seven laser lines (405, 458, 477, 488, 514, 543, 633 nm), motorized Z-drive and a wide range of ...

The inverted Nikon N-SIM/A1 microscope is a combination structured illumination microscopy (SIM), laser scanning confocal and total internal reflection fluorescence (TIRF) microscopy system. SIM and ...

Raman spectroscopic imaging is a powerful, versatile and increasingly common microscopy technique that can quickly identify molecules in a sample and visualize their distribution in three dimensions.