What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...

Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

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Thought LeaderProf. Dr. Sergei KalininProfessor & Chief Scientist in AI/ML for Physical SciencesUniversity of Tennessee & Pacific Northwest Laboratory In this interview, Prof. Dr. Sergei Kalinin ...

The biggest challenge with SPM is that the SPM data quality is inherently linked to the tip quality. As we all know, since its inception, SPM has become one of the go-to methods for nanoscale ...

Introduction to SNOM: The Scanning Near-field Optical Microscope (SNOM) stands as a pivotal analytical tool in nanotechnology, enabling the visualization of nanostructures with resolution beyond the ...

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Tim McCoy (right), the Smithsonian’s National Museum of Natural History curator of meteorites and the co-lead author on the new paper, with Cari Corrigan (left) sein a scanning electron microscopy lab ...

Scanning transmission electron microscopy, or STEM, is a powerful imaging technique that enables researchers to study a material’s morphology, composition, and bonding behavior at the angstrom scale.

The microscope combines a big telecentric photolithography lens with a large tube lens to create sharp, detailed images of large and curved samples. These lenses project the image onto a flat array of ...

The FEI 200kV Titan Themis Scanning Transmission Electron Microscope (STEM) is a scanning transmission electron microscope with several key capabilities. This microscope positions Michigan Tech ...