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Scanning Electron Microscopy (SEM) has revolutionized the realm of microscopic analysis. By delivering astonishingly detailed images of minuscule entities such as insects, bacteria, or even the ...
The FEI Philips XL 40 Environmental Scanning Microscope (ESEM) is a large-chamber, tungsten source, environmental scanning electron microscope capable of high and low vacuum imaging. The FEI Philips ...
A scanning electron microscope, acquired in 2016 with a grant from the National Science Foundation, provides a powerful tool for students, faculty, and visiting researchers to study the structure and ...
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