With the scanning electron microscope (SEM), scientists in a range of fields—from biology to materials science to microelectronics—can analyze the surface of objects with a resolution approaching ...

-Further evolution makes it possible to leave observation and analysis to the instrument, improving efficiency- TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & CEO Izumi Oi) announces the ...

A new method is using Monte Carlo simulations to extend the capabilities of transmission electron microscopy and answer fundamental questions in polymer science. With highly specialized instruments, ...

The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new scanning electron microscope (SEM), the JSM-IT700HR for unprecedentedly high throughput in ...

Over the last 20 years, the proliferation of research utilizing scanning electron microscopy (SEM) has driven the performance of systems towards higher resolution at lower voltages. This enthusiasm is ...

Electron microscopy has evolved into a suite of sophisticated techniques essential for investigating the structure and properties of materials at the nanoscale and beyond. By utilising focused ...

For more than 50 years, freeze-fracture electron microscopy has been widely accepted as a significant method in microscopic structural and biological research. Although components of the approach were ...

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With highly specialized instruments, we can see materials on the nanoscale – but we can’t see what many of them do. That limits researchers’ ability to develop new therapeutics and new technologies ...