KXAN

Global Wafer Test Probe Card Market to reach USD 3.88 billion by 2028

New market study finds that the top six manufacturers of Wafer Test Probe Card occupied nearly 72.09% global market share. LEWES, DELAWARE, UNITED STATES, November 30 ...
Semiconductor Engineering

Coping With Parallel Test Site-to-Site Variation

Testing multiple devices in parallel using the same ATE results in reduced test time and lower costs, but it requires engineering finesse to make it so. Minimizing test measurement variation for each ...
Electronic Design

ATE Interfacing Outgrows 12″ Probe Boards

A new paradigm for semiconductor manufacturing test is coming. Unfortunately, it’s not yet completely defined, and most manufacturers still retain the traditional split between so-called front-end and ...
Business Wire

Keysight’s New Parallel Parametric Test System Delivers High Throughput and Cost-Effective Wafer Test

SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
Morningstar

Aehr Test Systems and ISE Labs Announce Partnership on Wafer-Level Test and Burn-in for High-Performance Computing and Artificial Intelligence Processors

FREMONT, CA / ACCESS Newswire / November 3, 2025 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in solutions, today announced a strategic partnership with ISE ...
Nasdaq

Aehr Receives First Order for FOX(TM) Wafer Level Test and Burn-in System to be used for Gallium Nitride Semiconductor Engineering and Qualification

FREMONT, CA / ACCESSWIRE / December 14, 2023 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial customer ...
Seeking Alpha

FormFactor and Advantest Partner on Silicon Photonics Wafer-Level Test Cell to Enable High-Volume Manufacturing

The world’s fastest automated photonic alignment with nine-axis nano-precision, delivering significantly higher throughput compared to other technologies. Full integration of FormFactor’s Velox™ probe ...
Semiconductor Engineering

Device Validation: The Ultimate Test Frontier

This article is a condensed version of an article that appeared in the November/December 2022 issue of Chip Scale Review. Adapted with permission. Read the original ...
Digi Times

TSMC’s top wafer testing partner posts 78% surge as new facility ramps

Xintec Inc., TSMC's backend packaging and testing unit, posted a strong second-quarter 2025 rebound in wafer probe revenue, driven by increased outsourcing from TSMC and the accelerated ramp of a ...
Business Wire

Keysight, FormFactor, DMPI and VDI Join Forces to Deliver a New 170 GHz / 220 GHz Broadband Vector Network Analysis Solution

SANTA ROSA, Calif. & LIVERMORE, Calif. & CHARLOTTESVILLE, Va.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation ...
Digi Times

STAr Technologies unveils one-touch memory test probe card

STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...
Hackaday

Hair Today Gone Tomorrow: Four Men Go To Fix A Wafer Prober

I’ve had a fairly varied early part of my career in the semiconductors business: a series of events caused me to jump disciplines a little bit, and after one such event, I landed in the test ...