Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

Atomic force microscopy (AFM) is a high-resolution imaging technique that generates 3D images of sample surfaces and characterizes their nanomechanical properties. AFM can be used for several ...

A team lead by researchers from the National Institute for Materials Science (NIMS) in Tsukuba, Japan, used atomic force microscopy to apply force across the surface of various cells. The method uses ...

In this infographic, we dive into how atomic force microscopy (AFM) works, the technical features one must consider and how it can be implemented for biomechanical investigation. AFM provides ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale features ...

Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...

Force spectroscopy relies on the precise measurement of forces acting on a probe as it interacts with a sample. The key principles of force spectroscopy include: AFM-based force spectroscopy is the ...

BOSTON--(BUSINESS WIRE)-- Cellens, Inc., an early-stage cancer diagnostic company pioneering in applying mechanobiology and machine learning analysis today announced that it is collaborating with ...